(11−4−8) Cu基体とNi基体の比較
@ CuとNi−P/Au
塚本 主なはんだとCuの界面の典型的状態
Sn-0.7Cu、Sn-0.7Cu+Ni、SAC307、Sn-37Pb、BGA
2回リフロー
SEM cross-sectional micrographs of IMC layers formed at the solder/Cu substrate
interface
in 2-reflowed samples of (a) SC, (b) SCN, (c) SAC and (d) SP
SEM cross-sectional micrographs of IMC layers formed at the solder/Cu substrate
interface in the samples aged at 125 °C
for 1000 h. (a) SC, (b) SCN, (c) SAC and (d) SP
Average thickness of the IMC layers formed between the SC, SCN, SAC and
SP solders, and Cu substrates
in the samples subjected to 1, 2 and 4 reflows and after aging at 125 °C
for 500 and 1000 h.
Morphology parameter, M, for SC, SCN, SAC and SP samples subjected to 1, 2 and 4 reflows and
aged at 125 °C for 500 and 1000 h.
Failure model of BGA joints subjected to shear loadings. (a) Impact force-displacement
curves (SCN aged at 125 °C for 1000 h,
Displacement rates: 10, 100 and 4000 m/s). (b) SEM micrographs of
the same samples after shear impact tests. (c) Failure model.
Failure model of BGA joints subjected to tensile loadings. (a) Impact force-displacement
curves (SCN BGAs aged at 125 °C for 1000 h,
Displacement rates: 1 and 400 mm/s). (b) SEM micrographs of the same
samples after tensile impact tests. (c) Failure model.
The deformation energy and maximum force during the shear impact tests
for 2-reflowed and
aged SC ((a) and (b)), SCN ((c) and (d)), SAC ((e) and (f)) and SP ((g)
and (h)).
The deformation energy is divided into two parts such for before- and after-
maximum forces
The deformation energy and maximum load during the high speed shear impact
tests (4000 mm/s) for various reflow times (1, 2, and 4)
and aging time (at 125 °C for 500 and 1000 h). The deformation
energy is divided into two parts for the before- and after-maximum forces.
The failure types are also shown in the figures. (a) SC, (b) SCN, (c) SAC
and (d) SP
The deformation energy and maximum force during the tensile impact tests
for 2-reflowed and
aged SC ((a) and (b)), SCN ((c) and (d)), SAC ((e) and (f)) and SP ((g)
and (h)).
The deformation energy is divided into two parts such for before- and after-
maximum forces.
The deformation energy and maximum load during the high speed tensile impact
tests (400 mm/s) for various reflow times (1, 2, and 4)
and aging time (at 125 °C for 500 and 1000 h). The deformation
energy is divided into two parts such as the before-
and after-maximum force ones. The failure types are also shown in the figures.
(a) SC, (b) SCN, (c) SAC and (d) SP
同様にNi−P/Auの場合
SEM cross-sectional micrographs of IMC layers formed at the four types
of compositions of BGAs/NiAu substrate interface
in 2-reflowed samples of (a) SC, (b) SCN, (c) SAC and (d) SP
SEM cross-sectional micrographs of IMC layers formed at the four types
of compositions of BGAs/NiAu substrate interface
in deep aged (125 °C, 1000 h) samples of (a) SC, (b) SCN, (c)
SAC and (d) SP.
Average thickness of the IMC layers formed between the SC, SCN, SAC and
SP solders, and Ni (P)/Au surface-finished substrates
as a function of the number of reflows and aging time.
Ratio of height to bottom of a periodically arranged isosceles triangle in the IMC layers plotted against the reflow times and aging time.
The deformation energy and maximum force during the shear impact tests for 2-reflowed and aged SC ((a) and (b)), SCN ((c) and (d)), SAC ((e)
and (f)) and SP ((g) and (h)). The deformation energy is divided into two parts such for before- and after-maximum forces.
The deformation energy and maximum force during the high speed shear impact
tests (4000 mm/s) for various reflow times (1, 2, and 4)
and aging time (at 125 °C for 500 and 1000 h). The deformation
energy is divided into two parts for the before- and after-maximum forces.
The failure types are also shown in the figures. (a) SC, (b) SCN, (c) SAC
and (d) SP
The deformation energy and maximum force during the tensile impact tests for 2-reflowed and aged SC ((a) and (b)), SCN ((c) and (d)), SAC ((e) and (f)) and SP ((g) and (h)). The deformation energy is divided into two parts such for before- and after-maximum forces
The deformation energy and maximum force during the high speed tensile
impact tests (400 mm/s) for various reflow times (1, 2, and 4) and
aging time (at 125 °C for 500 and 1000 h). The deformation energy
is divided into two parts such as the before- and after-maximum force ones.
The failure types are also shown in the figures. (a) SC, (b) SCN, (c) SAC
and (d) SP
Yoon
Sn−0.7CuとCu、Ni−P/Au
The SEM micrographs of the Sn-0.7Cu/Cu interface reflowed at 255 °C
for various times; (a) 1 s, (b) 1 min, (c) 10 min and (d)
30 min.
The SEM micrographs of the Sn-0.7Cu/electroless Ni-P interface reflowed at 255 °C for various times; (a) 1 s, (b) 1 min, (c) 10 min and (d) 30 min.
The thickness of the Cu6Sn5, (Cu, Ni)6Sn5 and Ni3P layers formed at the interface between Sn?0.7Cu solder
and two different (Cu and electroless Ni?P) substrates with reflow time.
Lee
SAC3575BGA
Ni−15at%P/0.15μmAu
Song 香港理工大 IMC厚みの影響 ボール・シェアとコールド・バンプ・プル
Sn-3.5AgとSAC405、パッド:OSPとNi/Au(ENIG)、0.76mm球
せん断高さ80μm、プル・クランプ137.8kPa
Song
高速シェア及びプルと基板落下の比較、破壊モードと負荷速度
SAC405、ENIGとOSP、0.76mm球
せん断高さ50μm、クランプ2.2bar
Roggeman
SAC305、はんだマスク規定BGA、φ0.75mm、OSPと無電解Ni/Au(ENIG)
振り子衝撃試験、40Hz
OSPがENIGのほぼ倍の寿命。
OSPはCu6sn5層の亀裂、ENIGはNi3Sn4層内とCuパッド界面
エージング効果
NiのIMC成長は遅い。
Cuはボイド生成。
マイクロ衝撃疲労試験
温度依存はほとんどない、IMCは厚くなるがはんだが軟らかくなるので両者の効果が競合。
Nah
無電解Ni/Au
Sn−37Pb、Sn−3.5Ag、SAC387、リフローは210℃と250℃。
Sn−58Bi Yoon 成均館大
Cuと無電解Ni−P
A Cuと無電解Ni−P/Auと電解Ni/Au
Sharif
SnAgでCu
SnAgとSnPb Sharif
Sn−37Pb、Sn−3.5Ag、BGA
Sharif
SAC355、Sn−3.5Ag、Sn−0.7Cu、無電解Ni/0.5μmAu
電解Ni
BGA:Sn-3.5Ag、SAC355とパッド:電解Ni/0.5μmAu
B PCBがCu,BGAが電解Ni/AuまたはOSP
Lal Motorola
SAC387BGA(φ0.3mm)、BGAのパッド:電解Ni/AuまたはOSP Cu、PCBパッド:Cu
リフロー条件、P1:ピーク230℃、P2:245℃、P3:260℃
曲げ衝撃試験結果
C CuとNi/Au
Erinc
260℃リフロー、詳細不明、はんだペースト
D CuとNi
Soares
Sn−Zn−Bi−P、Sn−Cu−Bi−P
250℃で反応、CuとNi線